IEC INTERNATIONAL STANDARD 60748-4-3 First edition 2006-08 HOFENSERTAMUSENI HISLOCANIONBANYASORELED Y DOK SPLY BUREAU. Semiconductordevices- Integrated circuits Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC) IEC Referencenumber IEC 60748-4-3:2006(E) Publication numbering As from 1 January 1997 all IEC publications are issued with a designation in the 60000 series.For example,IEC 34-1is now referred to as IEC 60034-1. Consolidated editions The IEc is now publishing consolidated versions of its publications. For example, amendments 1 and 2. FurtherinformationonIECpublications The technical content of IEC publications is kept under constant review by the IEC, thus ensuring that the content reflects current technology. Information relating to HOCENSERTAMUSEI HISLOCANIONBANYASOPLIED BY BO SLYBUREAU. this.publication, including itsvalidity, is available in the IEc Catalogue of publications (see below) in addition to new editions, amendments and corrigenda. information on the subjects under consideration and work in progress undertaken by the technical committee which has prepared this publication, as well as the list of publications issued, is also available from the following: IEc Web Site (www.iec.ch) Catalogueof IECpublications The on-line catalogue on the IEC web site (www.iec.ch/searchpub) enables you to search by a variety of criteria including text searches,technical committees and date of publication. On-line information is also available on recently issued publications,withdrawn and replaced publications,as wellas corrigenda IECJustPublished This summary, of recently issued publications (www.iec.ch/online news/ justpub) is also available by email. Please contact the Customer Service Centre (see below) for further information SLP Customer Service Centre If you have any questions regarding this publication or need further assistance please contact the Customer Service Centre: Email: [email protected] Tel: +4122 919 02 11 Fax:+4122919 03 00 IEC INTERNATIONAL STANDARD 60748-4-3 First edition 2006-08 YOOKSPLYRA Semiconductordevices Integrated circuits Part 4-3: Ll Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC) NCH @ IEC 2006—Copyright -all rights reserved mechanical, including photocopying and microfilm, without permission in writing from the publisher. International Electrotechnical Commission, 3, rue de Varembe, PO Box 131, CH-1211 Geneva 20, Switzerland Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: [email protected] Web: www.iec.ch W IEC PRICE CODE Commission Electrotechnique Internationale International Electrotechnical Commission MekAyHapoAHag3nekTpoTexHuyeckagKomucCug For price, see current catalogue 60748-4-3@IEC:2006(E) 2 CONTENTS FOREWORD INTRODUCTION Scope 6 Normativereferences .6 2 3 Terms and definitions 4 Characteristics Measuring methods ... 5 5.1 Dynamic testing with sinusoidal signals . 5.2 Dynamic tests with wideband signals.. 22 Linearity error of a linear ADC (EL) (EL(adi) (ET) 5.3 .24 NSE 5.4 Differential linearity error (Ep) ... 30 ED1 NAMES AnnexA(informative)Mathematicalderivations 32 F A AnnexB(informative)Wideband signal generationandanalysis 35 Bibliography... 36 Figure 1-Test arrangement for measurements on ADCs under dynamic conditions. .9 Figure 2-Test arrangement for measurements on ADCs, using wideband signals .. .22 Figure 3-Record size versus total noise, for various numbers of records,ramp waveform input .. .25 Figure 4-Record size versus total noise, for various numbers of records, sine wave input 28 Table1-Confidence level versus rangeof variable (in standard deviations), 12 60748-4-3 @ IEC:2006(E) INTERNATIONALELECTROTECHNICALCOMMISSION SEMICONDUCTORDEVICES INTEGRATEDCIRCUITS Part 4-3:Interfaceintegrated circuits Dynamic criteria for analogue-digital converters (ADC) FOREWORD The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising 1) (IEC N