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IEC 60749-28 2022 Semiconductor devices - Mechanical and climatic test methods - Part 28 Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
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IEC 60749-28 2022 Semiconductor devices - Mechanical and climatic test methods - Part 28 Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
